SNJ54ABT18245AWD similaires

  • SNJ5400J
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES
  • SNJ5400W
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES
  • SNJ5400WA
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES
  • SNJ5401J
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
  • SNJ5401W
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
  • SNJ5402J
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES
  • SNJ5402J
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES
  • SNJ5402W
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SNJ54ABT18245AWD Datasheet et spécifications

Fabricant : TI 

Emballage : WD 

Pins : 56 

Température : Min -55 °C | Max 125 °C

Taille : 392 KB

Application : SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS 

SNJ54ABT18245AWD PDF Download

SNJ54ABT18245AWD PDF