SN74BCT8374ADWR spec: SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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SN74BCT8374ADWR Datasheet et spécifications

Fabricant : TI

Emballage : DW

Pins : 24

Température : Min 0 °C | Max 70 °C

Taille : 323 KB

Application : SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS