SN74BCT8244ADWR spec: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS

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SN74BCT8244ADWR Datasheet et spécifications

Fabricant : TI

Emballage : DW

Pins : 24

Température : Min 0 °C | Max 70 °C

Taille : 322 KB

Application : IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS