SN74LVTH182512DGGR spec: 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

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SN74LVTH182512DGGR Datasheet et spécifications

Fabricant : TI

Emballage : DGG

Pins : 64

Température : Min -40 °C | Max 85 °C

Taille : 569 KB

Application : 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS